Method and device for monitoring and confirming aging state of semiconductor device and computer readable storage medium

The invention relates to the technical field of semiconductor aging test, and discloses a method for monitoring and confirming the aging state of a semiconductor device, which comprises the followingsteps: continuously acquiring at least one performance parameter of the semiconductor device within a...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	LAI JUNSHENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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