Self-adjusting method and device for sample detection electrical parameters, medium and electronic equipment

The embodiment of the invention discloses a self-adjusting method and device for sample detection electrical parameters, a medium and electronic equipment. The method comprises the following steps: powering up a sample according to initial parameters to obtain a hot spot in an infrared image of the...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LIU ZHE, QIN DAN, GONG HUILAN
Format: Patent
Sprache:chi ; eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Beschreibung
Zusammenfassung:The embodiment of the invention discloses a self-adjusting method and device for sample detection electrical parameters, a medium and electronic equipment. The method comprises the following steps: powering up a sample according to initial parameters to obtain a hot spot in an infrared image of the sample; if a parameter adjustment event is detected, adjusting the power-up parameters according toa preset rule; and determining an optimal parameter according to the change rule of the hot spot. By implementing the scheme, the hot spot can be formed in a power-up mode under a lossless condition,and the optimal parameter for the hot spot to reach the optimal state can be sought by controlling the power-up parameter. 本申请实施例公开了一种样品检测电参数的自调节方法、装置、介质及电子设备。所述方法包括:按照初始参数,对样品加电,获取所述样品的红外图像中的热点;若检测到参数调节事件,按照预设规则对加电的参数进行调节;根据所述热点的变化规律,确定最佳参数。执行本方案,可以在无损的情况下,通过加电的方式形成热点,并且可以通过控制加电参数,寻求热点达到最理想状态下的最佳参数。