Aging screening test system and method for laser diode array

The invention provides an aging screening test system and method for a laser diode array, and the system comprises a laser diode array drive module, a temperature control module, an aging module, a screening test module, and a computer control collection module which is used for controlling the work...

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Hauptverfasser:	LI ZHITONG, LI ZUOHAN, LI JING, ZHAO YIMING, MA XUNPENG
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
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creator	LI ZHITONG LI ZUOHAN LI JING ZHAO YIMING MA XUNPENG
description	The invention provides an aging screening test system and method for a laser diode array, and the system comprises a laser diode array drive module, a temperature control module, an aging module, a screening test module, and a computer control collection module which is used for controlling the working conditions of the laser diode array and collecting and recording the test result of the screening test module. The screening test module comprises an electro-optical characteristic test module, a spectrum test module, a far-field test module, a near-field test module and a microscopic examination module. The method comprises near-field luminous point test and microscopic examination test functions as well as test screening after aging of the laser diode array, full-parameter screening test of the laser diode array is realized, and through aging test, film microscopic examination of electro-optic characteristics, spectra, far-field luminous points, near-field luminous points and luminoussurfaces of the laser dio
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The screening test module comprises an electro-optical characteristic test module, a spectrum test module, a far-field test module, a near-field test module and a microscopic examination module. 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The screening test module comprises an electro-optical characteristic test module, a spectrum test module, a far-field test module, a near-field test module and a microscopic examination module. The method comprises near-field luminous point test and microscopic examination test functions as well as test screening after aging of the laser diode array, full-parameter screening test of the laser diode array is realized, and through aging test, film microscopic examination of electro-optic characteristics, spectra, far-field luminous points, near-field luminous points and luminoussurfaces of the laser dio</abstract><oa>free_for_read</oa></addata></record>
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subjects	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR
title	Aging screening test system and method for laser diode array
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