Aging screening test system and method for laser diode array

The invention provides an aging screening test system and method for a laser diode array, and the system comprises a laser diode array drive module, a temperature control module, an aging module, a screening test module, and a computer control collection module which is used for controlling the working conditions of the laser diode array and collecting and recording the test result of the screening test module. The screening test module comprises an electro-optical characteristic test module, a spectrum test module, a far-field test module, a near-field test module and a microscopic examination module. The method comprises near-field luminous point test and microscopic examination test functions as well as test screening after aging of the laser diode array, full-parameter screening test of the laser diode array is realized, and through aging test, film microscopic examination of electro-optic characteristics, spectra, far-field luminous points, near-field luminous points and luminoussurfaces of the laser dio