STM32 total dose effect testing method based on preloaded program dynamic signal inspection

The invention relates to an STM32 total dose effect test method based on preloaded program dynamic signal inspection, the test method is carried out based on a test system, and the test system comprises a minimum circuit loaded with an STM32 chip, a communication module used for signal transmission and an upper computer used for receiving signals; wherein the preloading program comprises signal processing verification, storage verification and communication verification functions; the test method comprises the following steps: arranging a test system, verifying parameters before irradiation, monitoring irradiation and online functions, finishing irradiation, verifying parameters after irradiation, and analyzing damage. According to the test method provided by the invention, on one hand, the irradiation damage dose of the chip under the actual operation condition is obtained by constructing a minimum system, and on the other hand, the working state of each device in the chip is monitored through multiple dynam