Structural description method for electronic product test process

The invention discloses a structural description method for an electronic product test process, and belongs to the technical field of product testing. The method is characterized by comprising the following steps of: a, defining and expressing a test process design; b, combining the separated test units according to one of a sequence, a parallel sequence or a disordered sorting mode; and c, when the test units are combined in sequence, limiting the output result to influence the judgment of the next execution test unit or the judgment of the output result of the test group according to the output result combination of the previous test unit, and limiting the fault dictionary to influence the judgment of the output result of the test group when the test units are combined in sequence and disorderly. The judgment of the output result is used for correlating fault modes. The problem of description structuralization of the typical airborne system test process can be solved, accurate transmission and sharing of te