METHODS OF DETECTING BONDING BETWEEN A BONDING WIRE AND A BONDING LOCATION ON A WIRE BONDING MACHINE

A method of determining a bonding status between wire and at least one bonding location of a semiconductor device is provided. The method includes the steps of: (a) bonding a portion of wire to at least one bonding location of a semiconductor device using a bonding tool of a wire bonding machine; and (b) detecting whether another portion of wire engaged with the bonding tool, and separate from theportion of wire, contacts the portion of wire in a predetermined height range, thereby determining if the portion of wire is bonded to the at least one bonding location. 提供一种确定线材与半导体器件的至少一个焊接位置之间的焊接状况的方法。方法包括以下步骤：(a)利用焊线机的焊接工具，将线材的一部分焊接到半导体器件的至少一个焊接位置；以及(b)检测与焊接工具接合并与所述线材的一部分分离的线材的另一部分在预定高度范围中有无接触所述线材的一部分，由此确定所述线材的一部分是否被焊接到所述至少一个焊接位置。