METHOD FOR CALIBRATING AN ANALYTICAL MEASURING DEVICE AND MEASURING POINT FOR ANALYZING A PROCESS MEDIUM AND FOR CALIBRATING AN ANALYTICAL MEASURING DEVICE

The present disclosure relates to a method for calibrating an analytical measuring device (2) in a measuring point (1), wherein the method comprises at least the following steps: closing the inlet valve (10) so that no process medium is fed from the first inlet (3) into the measuring point (1), empt...

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Bibliographische Detailangaben
Hauptverfasser:	JUGERT STEPHAN, KASCHUBA DAGMAR, PFAUCH THOMAS, VETTERMANN JENS, MICHAEL HENKER, HENNINGS ERIK, TORSTEN PECHSTEIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	The present disclosure relates to a method for calibrating an analytical measuring device (2) in a measuring point (1), wherein the method comprises at least the following steps: closing the inlet valve (10) so that no process medium is fed from the first inlet (3) into the measuring point (1), emptying the measuring point of the process medium through the outlet valve (11), closing the outlet valve (11), feeding a predetermined volume of the calibration medium into the measuring point (1) through the inlet valve from the second inlet, circulating the calibration medium through the pump (14) so that the flow circuit is generated and the calibration medium flows against the analytical measuring device (2), wherein a predetermined flow velocity of the calibration medium is adjusted by the pump (14), and calibrating the analytical measuring device (2). 本申请涉及用于校准分析测量设备的方法以及测量点。本发明涉及一种用于在测量点(1)中校准分析测量设备(2)的方法，其中所述方法包括至少以下步骤：关闭入口阀(10)，以使得没有过程介质被从第一入口(3)馈送入测量点(1)；通过出口阀(11)清空过程介质的测量点(1)；关闭出口阀(11)；从第二入口(5)通过入口阀(10)将预确