Method for quickly judging normal refrigeration temperature of refrigeration type linear array infrared detector

The invention relates to a method for quickly judging whether the refrigeration temperature of a refrigeration type linear array infrared detector is normal or not. According to the characteristic that the refrigeration temperature of the refrigeration type linear array infrared detector is continuo...

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Bibliographische Detailangaben
Hauptverfasser: CHEN FUPU, SUN YANCHENG, LI YUYAN, JIN KUNKUN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to a method for quickly judging whether the refrigeration temperature of a refrigeration type linear array infrared detector is normal or not. According to the characteristic that the refrigeration temperature of the refrigeration type linear array infrared detector is continuously reduced in a normal working state, by presetting the temperature of the infrared detector, whether the refrigeration temperature of the infrared detector is normal or not is quickly judged. The whole detection process is shortened to two minutes, and the time for judging whether the refrigeration temperature of the infrared detector is normal or not is effectively shortened by 6-8 minutes compared with the original time. 本发明涉及一种快速判断制冷型线列红外探测器制冷温度正常的方法,根据制冷型线列红外探测器制冷温度在正常工作状态下不断下降的特点,通过预置红外探测器温度,快速判断出红外探测器制冷温度是否正常,整个检测过程缩短为二分钟,相对于原有的6~8分钟有效缩短判断红外探测器制冷温度是否正常的时间。