X-ray diffraction imaging bicrystal spectrometer

The invention relates to an X-ray diffraction imaging bicrystal spectrometer, and belongs to the field of spectrum detection devices. Aiming at a traditional spherical curved crystal spectrometer withaberration, the astigmatism-free X-ray diffraction imaging spectrometer based on the double-spherical curved crystal structure is provided, two spherical curved crystals are adopted, and the physicalrelationship of the two spherical curved crystals meets the condition that the negative ratio of the radiuses of the two spherical curved crystals is in direct proportion to the product of the cosinevalue of the corresponding Bragg angle and the tangent value of the double Bragg angles; the related X-ray crystal spectrometer can solve the problem of imaging aberration caused by inconsistent radial focusing focuses of a single spherical crystal on a meridian plane and a sagittal plane. According to the bicrystal X-ray diffraction imaging spectrometer provided by the invention, the X-rays diffracted by the two crystals