Ground test multi-dimensional optimization method for on-orbit fault prediction of spacecraft

The invention provides a ground test multi-dimensional optimization method for on-orbit fault prediction of a spacecraft. The method comprises the steps of determining characteristic parameters of a single machine to a platform; wherein characteristic parameters comprise relevancy vectors of all on-...

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Bibliographische Detailangaben
Hauptverfasser: WANG JING, SU XINMING, BI YANQIANG, XIANG SHUHONG, LI XIYUAN, DU CHUNLIN, JI XINYAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a ground test multi-dimensional optimization method for on-orbit fault prediction of a spacecraft. The method comprises the steps of determining characteristic parameters of a single machine to a platform; wherein characteristic parameters comprise relevancy vectors of all on-orbit faults and ground tests of the single machine; judging whether the relevancy between the single-machine on-orbit fault and the ground test is 0 or not; judging whether the number of ground faults exposed by the single machine in the ground test is 0 or not; establishing a result of whether theground test is tailored or not; giving corresponding optimization suggestions according to test item correlation, test condition correlation, test technology correlation and fault identification method correlation values of an on-orbit fault of the single machine and a ground test, and establishing and updating an optimization suggestion matrix of the single machine for the ground test. Characteristic parameters of a spa