Method and device for verifying precision of second-class measurement data of crop planting areas

The invention discloses a method and device for verifying precision of second-class measurement data of a crop planting area. The method comprises the following steps: determining a first vector pattern spot of a crop planting area to be measured when any crop is mature; determining a second vector...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: WANG XIAOYAN, CUI XIAOHE, JIANG TAO, LYU ZHENG
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a method and device for verifying precision of second-class measurement data of a crop planting area. The method comprises the following steps: determining a first vector pattern spot of a crop planting area to be measured when any crop is mature; determining a second vector pattern spot which has the same area range as the first vector pattern spot and is registered, the second vector pattern spot comprising classification information of field investigation; superposing the first vector pattern spot and the second vector pattern spot to solve an intersection to obtaina third vector pattern spot, and determining a plurality of ground object pattern spot areas according to the third vector pattern spot; establishing an error matrix according to the pattern spot area, and calculating the total precision, the user precision and the producer precision according to the error matrix; and calculating a pattern spot area error of each ground object, respectively calculating the value ranges of