Device and method for measuring ytterbium atomic group birefringence effect under action of magnetic field

The invention discloses a device and method for measuring the birefringence effect of ytterbium atomic groups under the action of a magnetic field and relates to the technical field of optical measurement. The device comprises a laser, a half-wave plate, an electrified solenoid for providing a unifo...

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Bibliographische Detailangaben
Hauptverfasser: HUANG LIDAN, ZHANG SHANCHAO, HUANG WEILONG, GENG MENGYAO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a device and method for measuring the birefringence effect of ytterbium atomic groups under the action of a magnetic field and relates to the technical field of optical measurement. The device comprises a laser, a half-wave plate, an electrified solenoid for providing a uniform magnetic field for the ytterbium atomic groups, a transparent right-angled trapezoidal containerfor containing ytterbium atoms, a to-be-measured ytterbium atomic group, a polarizer, imaging ytterbium and CCD detectors. A polarization interference structure is adopted, measurement of the ytterbium atomic group birefringence effect in the magnetic field is achieved according to the characteristics of the measured interference fringes, and compared with a traditional scheme, the device adopts acoaxial light path system, does not have moving parts, and is simple in structure, high in stability and high in reliability. The influence of movement or large vibration of parts on measurement canbe avoided, the cost is low