Short-wave infrared imaging spectrometer light splitting system and short-wave infrared imaging spectrometer

The invention provides a short-wave infrared imaging spectrometer light splitting system and a short-wave infrared imaging spectrometer. The problems that in the prior art, various Offner light splitting systems are poor in imaging quality and high in machining and adjusting difficulty are solved. T...

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Bibliographische Detailangaben
Hauptverfasser: SONG CHONG, LIU KAI, JIANG KAI, SHAN QIUSHA, LIU ZHAOHUI
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention provides a short-wave infrared imaging spectrometer light splitting system and a short-wave infrared imaging spectrometer. The problems that in the prior art, various Offner light splitting systems are poor in imaging quality and high in machining and adjusting difficulty are solved. The light splitting system adopts an object-image bilateral telecentric light path structure, and thesystem comprises a slit, a short-wave infrared detector, and a convex reflecting grating, a negative meniscus lens and a concave reflecting mirror which are coaxially arranged in sequence, wherein concave surfaces of the convex reflecting grating, the negative meniscus lens and the concave reflecting mirror all face the object side; light entering from the slit is reflected by the concave reflector and transmitted by the negative meniscus lens, then dispersed by the convex reflecting grating, transmitted by the negative meniscus lens and reflected by the concave reflector, and received and imaged by the short-wave in