Stamping parameter optimization method based on orthogonal test
The invention discloses a stamping parameter optimization method based on an orthogonal test, and the method comprises the following steps: S1, carrying out the full-process analysis of a stamping part, and preliminarily determining key factors affecting the size precision of the stamping part and t...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a stamping parameter optimization method based on an orthogonal test, and the method comprises the following steps: S1, carrying out the full-process analysis of a stamping part, and preliminarily determining key factors affecting the size precision of the stamping part and the upper and lower limits of each key factor; S2, designing a multi-factor multi-level test scheme according to the value range of each key factor, and carrying out a simulation test to obtain a main effect and an interaction effect of each key factor; S3, analyzing the simulation test data by usingMinitab software, verifying whether the key factor significantly influences the dimensional precision of the stamping part or not, obtaining an optimal parameter value combination of the key factor,and performing CAE simulation verification. According to the method, the influence primary and secondary of each key factor on the response and the proportion of mutual influence among the key factorscan be identified, the opt |
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