Polymer material trap parameter characterization device and method based on PSD method
The invention discloses a polymer material trap parameter characterization device and method based on a PSD method. The polymer material trap parameter characterization device and method are used forsolving the problem that trap parameters of a polymer material at a specific temperature cannot be ac...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a polymer material trap parameter characterization device and method based on a PSD method. The polymer material trap parameter characterization device and method are used forsolving the problem that trap parameters of a polymer material at a specific temperature cannot be accurately characterized in the prior art. The device comprises an excitation light leading-in module, a direct-current voltage leading-in module, a temperature regulation and control module and a current signal exporting module, wherein the excitation light leading-in module is used for leading in an excitation light source, wherein the excitation light source is used for exciting trapped charges of a to-be-detected sample; the direct-current voltage leading-in module is used for leading direct-current voltage into a front electrode of the to-be-tested sample; the temperature regulation and control module is used for regulating and controlling the temperature of the to-be-detected sample; the current signal exportin |
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