Method for identifying producing area of gem-grade zircon based on LA-ICP-MS

The invention relates to the technical field of gem identification, and particularly discloses a method for identifying a producing area of gem-grade zircon based on LA-ICP-MS. The method comprises: 1, establishing a gem-grade zircon production place identification model; preparing a sample to be id...

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Bibliographische Detailangaben
Hauptverfasser: WANG XUAN, YANG TINGTING, LI LANSEN, YANG QIANHAN, HUANG BOLING, ZHU YONG, SHEN JIANI, MA QINGZHENG, LI MIAO
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention relates to the technical field of gem identification, and particularly discloses a method for identifying a producing area of gem-grade zircon based on LA-ICP-MS. The method comprises: 1, establishing a gem-grade zircon production place identification model; preparing a sample to be identified, and selecting standard samples BIR-1G and BHVO-2G developed by the United States Geological Investigation Office as external standards; and 2, using an LA-ICP-MS technology, putting the sample to be identified and a standard sample in the step 1 into a laser ablation system sample bin to be subjected to laser ablation, analyzing collected microelement data, comparing with the production place identification model in the step 1, and acquiring an identification result. According to the identification method provided by the invention, the production place identification of the gem-grade zircon can be quickly completed, and a blank of the production place identification of the gem-grade zircon at present is f