High-level test system for HIRF test and test and verification method

The invention discloses a high-level test system for an HIRF test and a test and verification method. The high-level test system comprises a plurality of transmitting antennas arranged in a test area,a radio frequency source connected with the transmitting antennas, an acquisition device arranged in...

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Bibliographische Detailangaben
Hauptverfasser: HU YAHAN, SHI GUOCHANG, CHEN YANAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a high-level test system for an HIRF test and a test and verification method. The high-level test system comprises a plurality of transmitting antennas arranged in a test area,a radio frequency source connected with the transmitting antennas, an acquisition device arranged in the test area, a signal receiving unit connected with the acquisition device and a system state monitoring device. The method comprises the following steps of performing a high-level sweep frequency test by using a high-level test system to obtain abnormal frequency points of the high-level sweepfrequency test, performing a low-level sweep frequency test at the same frequency point as the high-level sweep frequency test by using a low-level equivalent test system to obtain abnormal frequencypoints of the low-level sweep frequency test, comparing the abnormal frequency point of the high-level frequency sweep test with the abnormal frequency point of the low-level frequency sweep test, andverifying a high-level test