Crystal form purity valuing method of gamma-HNIW crystal form standard substance

The invention provides a crystal form purity valuing method for a gamma-HNIW crystal form standard substance. The method specifically comprises the following steps: 1 extracting a powder sample; 2 respectively testing gamma-HNIW, acetone, moisture and other organic impurities in the gamma-HNIW cryst...

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Hauptverfasser: KANG YING, ZHANG GAO, CHANG HAI, SU PENGFEI, NING YANLI, ZHAO JUAN, LUAN JIEYU, LIU KE, ZHU YIJU, CHEN ZHIQUN, LI XIAOYU, WANG MINCHANG, PAN QING, WANG MING
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:The invention provides a crystal form purity valuing method for a gamma-HNIW crystal form standard substance. The method specifically comprises the following steps: 1 extracting a powder sample; 2 respectively testing gamma-HNIW, acetone, moisture and other organic impurities in the gamma-HNIW crystal form standard substance; performing X-ray powder diffraction test and full-spectrum fitting calculation to obtain the relative content of the gamma-HNIW crystal form in HNIW of all different crystal forms; performing nuclear magnetic resonance test, and adding fumaric acid with known purity intoa nuclear magnetic resonance hydrogen spectrum to test the acetone content; carrying out warm bench-coulometric test, and using a warm bench-coulometric titration method for testing the trace moisturecontent; carrying out liquid chromatography test, wherein a liquid chromatography normalization method is used for testing the content of other organic impurities; and 3 carrying out statistical analysis on test results of ga