PATTERN ACQUISITIONS IN EQUIVALENT TIME SAMPLING SYSTEMS

The present invention relates to a system and a method related with test and measurement system, more especially, relates to mode obtaining of tested signals in the equivalent-time sampling test and measurement system. The equivalent-time sampling test and measurement instrument for acquiring a repe...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	LIM ANDY K, BRUMMER NOAH, PEETERS WEEM JAN P
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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