PATTERN ACQUISITIONS IN EQUIVALENT TIME SAMPLING SYSTEMS

The present invention relates to a system and a method related with test and measurement system, more especially, relates to mode obtaining of tested signals in the equivalent-time sampling test and measurement system. The equivalent-time sampling test and measurement instrument for acquiring a repe...

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Bibliographische Detailangaben
Hauptverfasser: LIM ANDY K, BRUMMER NOAH, PEETERS WEEM JAN P
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The present invention relates to a system and a method related with test and measurement system, more especially, relates to mode obtaining of tested signals in the equivalent-time sampling test and measurement system. The equivalent-time sampling test and measurement instrument for acquiring a repeating pattern signal under test at or near a maximum sampling speed of the test and measurement instrument. The test and measurement instrument includes a first input configured to receive repeating pattern information about a signal under test, a second input configured to receive the signal undertest, one or more processors configured to determine an optimized trigger holdoff period that is set based on a minimum trigger holdoff period of a test and measurement instrument, and an acquisitionunit configured to acquire a portion of the signal under test every optimized trigger holdoff period. 本公开涉及与测试和测量系统相关的系统和方法,并且更特别地涉及在等效时间采样测试和测量系统中的被测信号的模式采集。一种等效时间采样测试和测量仪器,其用于在测试和测量仪器的最大采样速度或接近该最大采样速度下采集重复模式的被测信号。该测试和测量仪器包括: