Defect type identification method and system for solar cell

The invention provides a defect type identification method of a solar cell. The method comprises the following steps of positioning the defect on the surface of the solar cell from electroluminescentimages of the solar cell under different forward current densities, and extracting the electroluminescent intensity of the defect position; then establishing a distributed equivalent circuit model containing the defect, and simulating the electroluminescent intensity at the defect; modifying the series or parallel resistance parameters of a sub-circuit model corresponding to the defect through aniterative method, realizing the matching of the electroluminescence intensity of the defect under simulation and experiment conditions under different forward injection current densities, and classifying the defect types into the defects caused by series resistors or parallel resistors according to the modified resistance types. An electroluminescent imaging technology can well represent the defect points of various solar