Micrometer for measuring dimension of a conductive object

The present invention provides a micrometer that comprises: a frame of a conductive material; an anvil of a conductive material fixedly coupled to one end of the frame so as to be electrically insulated from the frame; a spindle of a conductive material coupled to the other end of the frame so as to be reciprocated in a direction of the anvil in conjunction with a rotation of a thimble while forming an electrical contact with the frame; and a control part configured to transmit a numerical value for a current distance between the anvil and the spindle according to a distance traveled by the spindle to an external device as a measurement when an electric short between the anvil and the frame occurs. With this configuration, the micrometer ensures the placement of a conductive object betweenthe anvil and the spindle such that the measurement is provided to the external device when the electric short between the anvil and the spindle occurs. 本发明提供了一种千分尺，其包括：导电材料的框架；导电材料的砧座，以与框架电绝缘的方式固定地耦合到框架的一端；导电材料的主轴，以与套筒的旋转同步