Interface relationship judgment method and device
The invention provides an interface relationship judgment method and device. The method comprises the following steps: collecting a two-phase crystal structure; selecting a two-phase crystal face according to the two-phase crystal structure; calculating an interface mismatch degree according to the...
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| creator | ZHANG ZHIBO WEN LITAO |
| description | The invention provides an interface relationship judgment method and device. The method comprises the following steps: collecting a two-phase crystal structure; selecting a two-phase crystal face according to the two-phase crystal structure; calculating an interface mismatch degree according to the two-phase crystal face; and judging an interface relationship according to the interface mismatch degree. According to the method, the two-phase crystal structure is obtained, the two-phase crystal face is selected, the mismatch degree is calculated according to the mismatch degree calculation formula, and therefore the two-phase interface relation is judged.
本发明提供一种界面关系判断方法及装置，该方法包括：获取两相晶体结构；根据两相晶体结构选取两相晶面；根据两相晶面计算界面错配度；根据界面错配度判断界面关系。本发明通过获取两相晶体结构，选取两相晶面，根据错配度计算公式计算错配度，从而判断两相界面关系。 |
| format | Patent |
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本发明提供一种界面关系判断方法及装置，该方法包括：获取两相晶体结构；根据两相晶体结构选取两相晶面；根据两相晶面计算界面错配度；根据界面错配度判断界面关系。本发明通过获取两相晶体结构，选取两相晶面，根据错配度计算公式计算错配度，从而判断两相界面关系。</description><language>chi ; eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; PHYSICS</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201127&DB=EPODOC&CC=CN&NR=112000638A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20201127&DB=EPODOC&CC=CN&NR=112000638A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZHANG ZHIBO</creatorcontrib><creatorcontrib>WEN LITAO</creatorcontrib><title>Interface relationship judgment method and device</title><description>The invention provides an interface relationship judgment method and device. The method comprises the following steps: collecting a two-phase crystal structure; selecting a two-phase crystal face according to the two-phase crystal structure; calculating an interface mismatch degree according to the two-phase crystal face; and judging an interface relationship according to the interface mismatch degree. According to the method, the two-phase crystal structure is obtained, the two-phase crystal face is selected, the mismatch degree is calculated according to the mismatch degree calculation formula, and therefore the two-phase interface relation is judged.
本发明提供一种界面关系判断方法及装置，该方法包括：获取两相晶体结构；根据两相晶体结构选取两相晶面；根据两相晶面计算界面错配度；根据界面错配度判断界面关系。本发明通过获取两相晶体结构，选取两相晶面，根据错配度计算公式计算错配度，从而判断两相界面关系。</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD0zCtJLUpLTE5VKErNSSzJzM8rzsgsUMgqTUnPTc0rUchNLcnIT1FIzEtRSEkty0xO5WFgTUvMKU7lhdLcDIpuriHOHrqpBfnxqcUFQKPyUkvinf0MDY0MDAzMjC0cjYlRAwCvGCvH</recordid><startdate>20201127</startdate><enddate>20201127</enddate><creator>ZHANG ZHIBO</creator><creator>WEN LITAO</creator><scope>EVB</scope></search><sort><creationdate>20201127</creationdate><title>Interface relationship judgment method and device</title><author>ZHANG ZHIBO ; WEN LITAO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN112000638A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>ZHANG ZHIBO</creatorcontrib><creatorcontrib>WEN LITAO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZHANG ZHIBO</au><au>WEN LITAO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Interface relationship judgment method and device</title><date>2020-11-27</date><risdate>2020</risdate><abstract>The invention provides an interface relationship judgment method and device. The method comprises the following steps: collecting a two-phase crystal structure; selecting a two-phase crystal face according to the two-phase crystal structure; calculating an interface mismatch degree according to the two-phase crystal face; and judging an interface relationship according to the interface mismatch degree. According to the method, the two-phase crystal structure is obtained, the two-phase crystal face is selected, the mismatch degree is calculated according to the mismatch degree calculation formula, and therefore the two-phase interface relation is judged.
本发明提供一种界面关系判断方法及装置，该方法包括：获取两相晶体结构；根据两相晶体结构选取两相晶面；根据两相晶面计算界面错配度；根据界面错配度判断界面关系。本发明通过获取两相晶体结构，选取两相晶面，根据错配度计算公式计算错配度，从而判断两相界面关系。</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING PHYSICS |
| title | Interface relationship judgment method and device |
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