Interface relationship judgment method and device
The invention provides an interface relationship judgment method and device. The method comprises the following steps: collecting a two-phase crystal structure; selecting a two-phase crystal face according to the two-phase crystal structure; calculating an interface mismatch degree according to the...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides an interface relationship judgment method and device. The method comprises the following steps: collecting a two-phase crystal structure; selecting a two-phase crystal face according to the two-phase crystal structure; calculating an interface mismatch degree according to the two-phase crystal face; and judging an interface relationship according to the interface mismatch degree. According to the method, the two-phase crystal structure is obtained, the two-phase crystal face is selected, the mismatch degree is calculated according to the mismatch degree calculation formula, and therefore the two-phase interface relation is judged.
本发明提供一种界面关系判断方法及装置,该方法包括:获取两相晶体结构;根据两相晶体结构选取两相晶面;根据两相晶面计算界面错配度;根据界面错配度判断界面关系。本发明通过获取两相晶体结构,选取两相晶面,根据错配度计算公式计算错配度,从而判断两相界面关系。 |
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