Electronic complete machine accelerated storage test acceleration factor analysis method based on failure big data
According to a failure big data-based electronic complete machine accelerated storage test acceleration factor analysis method provided by the invention, the failure big data obtained by different types of electronic complete machines in the storage process is utilized to analyze the acceleration fa...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | According to a failure big data-based electronic complete machine accelerated storage test acceleration factor analysis method provided by the invention, the failure big data obtained by different types of electronic complete machines in the storage process is utilized to analyze the acceleration factors of the electronic complete machines more accurately, so that the accuracy of storage period verification is improved. The method specifically comprises the steps of obtaining a part list of an electronic complete machine; querying storage failure information of each part model in the part listaccording to a quality database of the electronic complete machine to form an electronic complete machine failure part list; calculating or looking up a table to obtain the failure rate of each partin the failure part list at the storage temperature Tu and the accelerated storage test temperature TA, and forming a part failure rate table; and analyzing an acceleration factor Af of the accelerated storage test according t |
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