Substation secondary system optical loop fault positioning method and device
The invention provides a transformer substation secondary system optical loop fault positioning method and device, and the method comprises the steps: carrying out the statistics of fault elements inan optical loop according to the information data in a transformer substation secondary system; count...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a transformer substation secondary system optical loop fault positioning method and device, and the method comprises the steps: carrying out the statistics of fault elements inan optical loop according to the information data in a transformer substation secondary system; counting the fault elements passed by each optical loop to form a statistical table of the fault elements passed by the optical loop; according to the statistical table and the fault elements, creating a matrix of the optical loop passing through the fault elements; judging a fault light loop corresponding to the alarm according to the information data; assigning a same numerical value to a fault element passed by a fault optical loop in the matrix, and assigning another same numerical value to a fault element passed by a non-fault optical loop to form a matrix; performing numerical statistics on the matrix to obtain fault elements, fault optical loops and corresponding statistical values, and performing fault positioni |
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