Display substrate, test method thereof and display device

The embodiment of the invention provides a display substrate, a preparation method thereof and a display device, which can improve the precision of a pixel measurement position. The display substratecomprises a display area and a peripheral area arranged in the periphery of the display area of the d...

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Bibliographische Detailangaben
Hauptverfasser:	DONG RUI, FU HUANZHANG, ZHAO YAN, JIAN SHUAIMIN, SUN LUBIAO, MA QINGLIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS SEMICONDUCTOR DEVICES TESTING
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Beschreibung
Zusammenfassung:	The embodiment of the invention provides a display substrate, a preparation method thereof and a display device, which can improve the precision of a pixel measurement position. The display substratecomprises a display area and a peripheral area arranged in the periphery of the display area of the display substrate; the display substrate also comprises a substrate body, a first pattern layer andat least one second pattern layer; the first pattern layer is arranged on the substrate, the first pattern layer can reflect light, the first pattern layer comprises a first pattern located in the display area and a first reserved pattern located in the peripheral area, and the first reserved pattern is provided with a hollow part; the at least one second pattern layer is arranged on the substrateand is positioned at the side, far away from the substrate, of the first pattern layer; each second pattern layer comprises a second pattern located in the display area and a second reserved patternlocated in the peripheral ar