High-precision measurement system with ultra-high impedance of precision low-voltage device
The invention provides a high-precision measurement system with the ultra-high impedance of a precise low-voltage device, wherein the high-precision measurement system is simple in structure, low in cost, high in efficiency and high in performance. The system comprises an MCU (1), an AC source signa...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a high-precision measurement system with the ultra-high impedance of a precise low-voltage device, wherein the high-precision measurement system is simple in structure, low in cost, high in efficiency and high in performance. The system comprises an MCU (1), an AC source signal generation device (2), an isolation coupling device (3), a DC impedance measurement device (5), anAC impedance measurement device (6), a channel switching device (7), a to-be-measured product access device (8) and a power supply. A shielding device (9) is arranged outside the to-be-tested productaccess device (8); the DC impedance measurement device (5) and the AC impedance measurement device (6) are respectively connected with the to-be-measured product access device (8) and measure the impedance of a to-be-measured product. Protection rings (10) are arranged between the DC impedance measurement device (5) and the to-be-tested product access device (8) and between the AC impedance measurement device (6) and the |
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