Test system, test method and test development method for semiconductor memory aging

The invention discloses a test system, a test method and a test development method for semiconductor memory aging. In the system, a public library provides aging test data for a main program; a plug-in module sends a plug-in calling instruction to the main program; the main program loads a corresponding plug-in in the plug-in module or does not load any plug-in; and the plug-in module comprises alower computer core board monitoring plug-in, a chip aging test function plug-in, a temperature control plug-in and a chip information monitoring plug-in. According to the invention, plug-in modularization is carried out on an aging test, so a loose coupling design of the aging test system and hardware is realized, the complexity of the system is reduced, each plug-in module can be independently developed and maintained, the stability, robustness and expansibility of the system are improved, the updating iteration speed of the aging test system is accelerated, research and development cost isreduced, and the research