Tuning fork type atomic force microscope probe and application

The invention provides a tuning fork type atomic force microscope probe. The probe comprises a quartz tuning fork, a current amplifier and a compensation circuit. The invention further provides application of the probe. The distributed capacitance compensation can be realized, and the current signal passing through the quartz tuning fork can be amplified at the temperature of 10mK, so that the amplitude of the driving voltage can be reduced, and the measurement resolution can be expected to be improved. 本发明提供了一种音叉型原子力显微镜探头，所述探头包括石英音叉、电流放大器及补偿电路。还提供了该探头的应用。既可以实现对分布电容的补偿又可以在10mK温度对通过石英音叉的电流信号进行放大，从而可以降低驱动电压的幅度，以期望提高测量的分辨率。