SEMICONDUCTOR LASER DEVICE AND ANALYSIS APPARATUS

The present invention relates to a semiconductor laser device capable of reducing a measurement error of a temperature detecting element for detecting the temperature of a semiconductor laser elementand accurately controlling the temperature of the semiconductor laser element. The semiconductor lase...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	ISEKI HIROTAKA, AWANE YUSUKE, ARIMOTO KIMIHIKO, MASUDA SHINTARO, MATSUHAMA MAKOTO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	BASIC ELECTRIC ELEMENTS COLORIMETRY DEVICES USING STIMULATED EMISSION ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT,POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED,VISIBLE OR ULTRA-VIOLET LIGHT MEASURING PHYSICS RADIATION PYROMETRY TESTING
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