SEMICONDUCTOR LASER DEVICE AND ANALYSIS APPARATUS
The present invention relates to a semiconductor laser device capable of reducing a measurement error of a temperature detecting element for detecting the temperature of a semiconductor laser elementand accurately controlling the temperature of the semiconductor laser element. The semiconductor lase...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The present invention relates to a semiconductor laser device capable of reducing a measurement error of a temperature detecting element for detecting the temperature of a semiconductor laser elementand accurately controlling the temperature of the semiconductor laser element. The semiconductor laser device is used for optical analysis and includes: a semiconductor laser element 2; a temperaturedetecting element 3 that detects the temperature of the semiconductor laser element 2; output terminals T1 and T2 that output the output of the temperature detecting element 3 to the outside; wires L1and L2 that electrically connect the temperature detecting element 3 and the output terminals T1 and T2; and a heat capacity increasing part 7 that is provided interposed between the temperature detecting element 3 and output terminal T1, and the output terminal T2, and contacts with at least part of the wires L1 and L2 to increase the heat capacity of the wires L1 or L2.
本发明提供半导体激光装置以及分析装置。一种半导体激光装置,用于光学分析,能够减小检测半导体激光元件的温 |
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