Semiconductor device and manufacturing method thereof
The present invention provides a semiconductor device including a transistor having a source/drain region. A conductive contact is disposed over the source/drain region. A silicide element is disposedbelow the conductive contact. The silicide element has a non-angular cross-sectional profile. In som...
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creator | CHEN SHENG-WEN LO CHIA-PING LIN YU-TING LIN YAN-HUA TAN LUN-KUANG SHIH YU-SHEN |
description | The present invention provides a semiconductor device including a transistor having a source/drain region. A conductive contact is disposed over the source/drain region. A silicide element is disposedbelow the conductive contact. The silicide element has a non-angular cross-sectional profile. In some embodiments, the silicide element may have an approximately curved cross-sectional profile, for example an ellipse-like profile. The silicide element is formed at least in part by forming an amorphous region in the source/drain region via an implantation process. The implantation process may be acold implantation process. A contact silicide having a non-angular profile is also provided.
本发明提供了一种半导体器件,该半导体器件包括具有源极/漏极区的晶体管。导电接触件设置在源极/漏极区上方。硅化物元件设置在导电接触件下方。硅化物元件具有无角的截面轮廓。在一些实施例中,硅化物元件可具有近似弧形的截面轮廓,例如,类椭圆形的轮廓。通过注入工艺在源极/漏极区中形成非晶硅区来至少部分地形成硅化物元件。注入工艺可以是冷注入工艺。本发明还提供了具有无角轮廓的接触件硅化物。 |
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本发明提供了一种半导体器件,该半导体器件包括具有源极/漏极区的晶体管。导电接触件设置在源极/漏极区上方。硅化物元件设置在导电接触件下方。硅化物元件具有无角的截面轮廓。在一些实施例中,硅化物元件可具有近似弧形的截面轮廓,例如,类椭圆形的轮廓。通过注入工艺在源极/漏极区中形成非晶硅区来至少部分地形成硅化物元件。注入工艺可以是冷注入工艺。本发明还提供了具有无角轮廓的接触件硅化物。</description><language>chi ; eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; SEMICONDUCTOR DEVICES</subject><creationdate>2020</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200908&DB=EPODOC&CC=CN&NR=111640792A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20200908&DB=EPODOC&CC=CN&NR=111640792A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CHEN SHENG-WEN</creatorcontrib><creatorcontrib>LO CHIA-PING</creatorcontrib><creatorcontrib>LIN YU-TING</creatorcontrib><creatorcontrib>LIN YAN-HUA</creatorcontrib><creatorcontrib>TAN LUN-KUANG</creatorcontrib><creatorcontrib>SHIH YU-SHEN</creatorcontrib><title>Semiconductor device and manufacturing method thereof</title><description>The present invention provides a semiconductor device including a transistor having a source/drain region. A conductive contact is disposed over the source/drain region. A silicide element is disposedbelow the conductive contact. The silicide element has a non-angular cross-sectional profile. In some embodiments, the silicide element may have an approximately curved cross-sectional profile, for example an ellipse-like profile. The silicide element is formed at least in part by forming an amorphous region in the source/drain region via an implantation process. The implantation process may be acold implantation process. A contact silicide having a non-angular profile is also provided.
本发明提供了一种半导体器件,该半导体器件包括具有源极/漏极区的晶体管。导电接触件设置在源极/漏极区上方。硅化物元件设置在导电接触件下方。硅化物元件具有无角的截面轮廓。在一些实施例中,硅化物元件可具有近似弧形的截面轮廓,例如,类椭圆形的轮廓。通过注入工艺在源极/漏极区中形成非晶硅区来至少部分地形成硅化物元件。注入工艺可以是冷注入工艺。本发明还提供了具有无角轮廓的接触件硅化物。</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2020</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDANTs3NTM7PSylNLskvUkhJLctMTlVIzEtRyE3MK01LTC4pLcrMS1fITS3JyE9RKMlILUrNT-NhYE1LzClO5YXS3AyKbq4hzh66qQX58anFBYnJqXmpJfHOfoaGhmYmBuaWRo7GxKgBAJ1ELZ4</recordid><startdate>20200908</startdate><enddate>20200908</enddate><creator>CHEN SHENG-WEN</creator><creator>LO CHIA-PING</creator><creator>LIN YU-TING</creator><creator>LIN YAN-HUA</creator><creator>TAN LUN-KUANG</creator><creator>SHIH YU-SHEN</creator><scope>EVB</scope></search><sort><creationdate>20200908</creationdate><title>Semiconductor device and manufacturing method thereof</title><author>CHEN SHENG-WEN ; LO CHIA-PING ; LIN YU-TING ; LIN YAN-HUA ; TAN LUN-KUANG ; SHIH YU-SHEN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_CN111640792A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>chi ; eng</language><creationdate>2020</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>CHEN SHENG-WEN</creatorcontrib><creatorcontrib>LO CHIA-PING</creatorcontrib><creatorcontrib>LIN YU-TING</creatorcontrib><creatorcontrib>LIN YAN-HUA</creatorcontrib><creatorcontrib>TAN LUN-KUANG</creatorcontrib><creatorcontrib>SHIH YU-SHEN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CHEN SHENG-WEN</au><au>LO CHIA-PING</au><au>LIN YU-TING</au><au>LIN YAN-HUA</au><au>TAN LUN-KUANG</au><au>SHIH YU-SHEN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Semiconductor device and manufacturing method thereof</title><date>2020-09-08</date><risdate>2020</risdate><abstract>The present invention provides a semiconductor device including a transistor having a source/drain region. A conductive contact is disposed over the source/drain region. A silicide element is disposedbelow the conductive contact. The silicide element has a non-angular cross-sectional profile. In some embodiments, the silicide element may have an approximately curved cross-sectional profile, for example an ellipse-like profile. The silicide element is formed at least in part by forming an amorphous region in the source/drain region via an implantation process. The implantation process may be acold implantation process. A contact silicide having a non-angular profile is also provided.
本发明提供了一种半导体器件,该半导体器件包括具有源极/漏极区的晶体管。导电接触件设置在源极/漏极区上方。硅化物元件设置在导电接触件下方。硅化物元件具有无角的截面轮廓。在一些实施例中,硅化物元件可具有近似弧形的截面轮廓,例如,类椭圆形的轮廓。通过注入工艺在源极/漏极区中形成非晶硅区来至少部分地形成硅化物元件。注入工艺可以是冷注入工艺。本发明还提供了具有无角轮廓的接触件硅化物。</abstract><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY SEMICONDUCTOR DEVICES |
title | Semiconductor device and manufacturing method thereof |
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