CALIBRATION CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING THE SAME
The invention discloses a calibration circuit and a semiconductor apparatus including the same. The calibration circuit includes a reference resistor leg, a calibration code generation circuit, and anemphasis circuit. The reference resistor leg is coupled to an external reference resistor through a...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention discloses a calibration circuit and a semiconductor apparatus including the same. The calibration circuit includes a reference resistor leg, a calibration code generation circuit, and anemphasis circuit. The reference resistor leg is coupled to an external reference resistor through a reference resistor node, and changes a voltage level of the reference resistor node based on a calibration code. The emphasis circuit accelerates a voltage level change of the reference resistor node based on the calibration code.
本申请公开了校准电路以及包括其的半导体装置。一种校准电路包括参考电阻器分支、校准码发生电路和加重电路。参考电阻器分支通过参考电阻器节点耦接到外部参考电阻器,并且基于校准码来改变参考电阻器节点的电压电平。加重电路基于校准码来使参考电阻器节点的电压电平改变加速。 |
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