Interactive instrument measurement analytics

Interactive instrument measurement analytics. A test and measurement instrument includes a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and locati...

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Hauptverfasser: RULE KEITH D, MARTY SEAN T
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:Interactive instrument measurement analytics. A test and measurement instrument includes a memory configured to store a waveform data record; one or more processors, and a display. The one or more processors are configured to receive the waveform data record, determine a measurement value and location for a plurality of occurrences of a measurement event in the waveform data record, detect one ormore logical path segments in the plurality of occurrences, and generating a visual representation of each measurement value and overlaying each of the visual representations of each measurement value. The visual representations of each measurement value and/or the one or more logical path segments may be displayed on the display. 本发明涉及交互式仪器测量分析。一种测试和测量仪器包括:被配置成存储波形数据记录的存储器;一个或多个处理器;以及显示器。所述一个或多个处理器被配置成接收波形数据记录,确定波形数据记录中的针对测量事件的多个出现的测量值和位置,检测所述多个出现中的一个或多个逻辑路径段,以及生成每个测量值的可视表示并叠加每个测量值的可视表示中的每一个。一个或多个逻辑路径段和/或每个测量值的可视表示可以显示在显示器上。