Localization of potential issues to objects

In some examples, a system identifies a potential issue based on comparing measurement data acquired at different hierarchical levels of a computing environment. Within a hierarchical level of the different hierarchical levels, the system determines, based on measurement data acquired for objects in...

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Bibliographische Detailangaben
Hauptverfasser: COOKE RAYMOND MARK, ADAMSON DAVID NELLINGER, SAMALLA ADITYA
Format: Patent
Sprache:chi ; eng
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Zusammenfassung:In some examples, a system identifies a potential issue based on comparing measurement data acquired at different hierarchical levels of a computing environment. Within a hierarchical level of the different hierarchical levels, the system determines, based on measurement data acquired for objects in the hierarchical level, whether the potential issue is localized to a subset of the objects. 在一些示例中,一种系统基于比较在计算环境的不同分级层获取的测量数据来识别潜在问题。在所述不同分级层中的分级层内,所述系统基于针对该分级层中的对象获取的测量数据来确定是否将所述潜在问题定位到所述对象的子集。