A method of evaluating cross-sectional geometry parameters of sample
The invention discloses a method for evaluating geometrical shape parameters of a cross section of a sample, and belongs to the technical field of precision measurement and computer-aided measurementand analysis. The method designed by the invention is based on an image processing technology, and th...
Gespeichert in:
Hauptverfasser: | , , , , , , , , , , |
---|---|
Format: | Patent |
Sprache: | chi ; eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
Zusammenfassung: | The invention discloses a method for evaluating geometrical shape parameters of a cross section of a sample, and belongs to the technical field of precision measurement and computer-aided measurementand analysis. The method designed by the invention is based on an image processing technology, and the geometrical shape parameters of the cross section of the sample are known by performing image collection on the acquired related cross section of the to-be-tested sample, processing the edge image information and then performing measurement and calculation on the acquired image. The design methodis high in measurement precision and high in efficiency.
本发明公开了一种评价试样截面几何形状参数的方法,属于精密测量和计算机辅助测量分析技术领域。本发明设计的方法基于图像处理技术,通过对采集的待测试样的相关截面进行图像采集,并对边缘图像信息进行处理后对采集的图像进行测量计算,从而知晓样截面的几何形状参数。该设计方法测量精度高,效率高。 |
---|