Test method, device and equipment and readable storage medium

The invention discloses a test method, device and equipment and a readable storage medium. The method disclosed by the invention comprises the following steps: obtaining a first checksum of a first result obtained by calculation of a software module and a second checksum of a second result obtained...

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1. Verfasser: YANG ZIPAN
Format: Patent
Sprache:chi ; eng
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Beschreibung
Zusammenfassung:The invention discloses a test method, device and equipment and a readable storage medium. The method disclosed by the invention comprises the following steps: obtaining a first checksum of a first result obtained by calculation of a software module and a second checksum of a second result obtained by calculation of an FPGA module, wherein the software module and the FPGA module execute the same data processing logic, and the first result corresponds to the second result; if the first checksum and the second checksum meet a preset condition, determining that the test is passed. According to the invention, the checksums in one-to-one correspondence with the results are compared and tested, so the processing speed is relatively high, the consumed time is shorter, and the test efficiency is improved. Correspondingly, the invention also discloses a test device, equipment and a readable storage medium, which also have the above technical effects. 本申请公开了一种测试方法、装置、设备及可读存储介质。本申请公开的方法包括:获取软件模块计算获得的第一结果的第一校验和,以及FPGA模块计