Metal ion monitoring system

The invention discloses a metal ion monitoring system, which comprises a sampling module used for obtaining a sample of a cleaning reagent from a cleaning tank of cleaning equipment at preset time intervals; a detection module which is used for detecting the concentration of metal ions in the sample...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	FENG QINXU, LIANG JIN'E, ZHAO BO, XING ZHONGHAO
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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