MEASUREMENT DEVICE, CALIBRATION CURVE GENERATION SYSTEM, SPECTRUM MEASUREMENT METHOD, CALIBRATION CURVE GENERATION METHOD, ANALYSIS DEVICE, LIQUEFIED GAS PRODUCTION PLANT, AND PROPERTY ANALYSIS METHOD
The invention provides a measurement device, a calibration curve generation system, a spectrum measurement method, a calibration curve generation method, an analysis device, a liquefied gas productionplant and a property analysis method. The measurement device (200) includes: a container (201) into...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The invention provides a measurement device, a calibration curve generation system, a spectrum measurement method, a calibration curve generation method, an analysis device, a liquefied gas productionplant and a property analysis method. The measurement device (200) includes: a container (201) into which sample gas is to be injected; a liquefaction mechanism (210) configured to liquefy the samplegas in the container (201); a near-infrared probe (202) extending from inside to outside the container (201); and a near-infrared measuring instrument (203) configured to measure an absorbance spectrum of the sample gas in a state of being liquefied by the liquefaction mechanism (210), via the near-infrared probe (202).
本发明提供测量装置、校准线制作系统、光谱测量方法、校准线制作方法、分析装置、液化气制造设备以及性状分析方法,测量装置(200)包括:容器(201),样品气体注入容器(201);液化机构(210),使容器(201)内的样品气体液化;近红外探针(202),从容器(201)内延伸至容器(201)外;以及近红外测量器(203),通过近红外探针(202)测量通过液化机构(210)而液化的状态的样品气体的吸光度光谱。 |
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