Test pattern generation device

The invention provides a test pattern generation device that generates test input sequences for testing a sequence program, calculates all possible states and state changes taken for each of input signals of the sequence program, generates test patterns in which each of the calculated state changes of the input signals is combined with the states or the state changes of another of the input signals, and generates the test input sequences on the basis of the generated test patterns. 本发明提供一种测试模式生成装置，生成用于测试顺控程序的测试输入序列，该测试模式生成装置针对顺控程序的输入信号分别求出能够采取的所有状态、状态变化，针对所求出的输入信号的状态变化分别生成与其他的信号的状态或状态变化组合后得到的测试模式，并且根据所生成的测试模式来生成测试输入序列。