Clamp type testing device

The invention provides a clamp type testing device. The clamp type testing device comprises a first clamping piece and a second clamping piece. The first clamping piece defines a first surface, a first end and a second end and is provided with a conductive module, and the conductive module is arrang...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: GUO XIUWEI, LIU MAOSHENG, WANG MINGHUI, WEN ZHENZHOU
Format: Patent
Sprache:chi ; eng
Schlagworte:
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Beschreibung
Zusammenfassung:The invention provides a clamp type testing device. The clamp type testing device comprises a first clamping piece and a second clamping piece. The first clamping piece defines a first surface, a first end and a second end and is provided with a conductive module, and the conductive module is arranged on the first surface. The second clamping piece defines a third end and a fourth end, the fourthend is connected with the second end, the third end and the first end are spaced by a first distance, and the first surface of the first clamping piece faces the second clamping piece. The conductivemodule is provided with a seat body and a plurality of conductive pieces. The seat body is provided with a plurality of jacks, and each conductive piece is accommodated in one of the plurality of jacks in a pluggable manner. Each conductive piece is provided with a first cantilever and a first bent part, the first bent part is connected with the first cantilever, the first cantilever extends out of one of the plurality of