Power semiconductor device dynamic electrical stress applying device and testing method

The invention relates to a power semiconductor device dynamic electrical stress applying device. The device comprises a signal generator, an optocoupler protection module, a gate pulse driving module,a high-voltage control module and the n tested power semiconductor devices, wherein the signal generator, the optical coupler protection module and the gate pulse driving module are sequentially connected to the gates of the n tested power semiconductor devices in series; the high-voltage control module is connected with the drains of the n tested power semiconductor devices, and the sources of the n tested power semiconductor devices are grounded. The invention also relates to a power semiconductor device dynamic electrical stress test method. According to the invention, dynamic electrical stress can be applied to one or more tested power semiconductor devices at the same time; photoelectric isolation of the signal generator and a high-voltage circuit is realized through the optical coupler protection module, de