FAILURE PREDICTION BY CELL PROBING

Disclosed are systems and methods for failure prediction by cell probing. A method includes receiving a write request. The method also includes applying a predetermined number of programming pulses toa plurality of memory cells within a block of a flash memory device. The method also includes applying a verify pulse to each respective one of the plurality of memory cells. The method also includesstoring programming status of the plurality of memory cells into a set of latches. The method also includes determining, based on the stored programming status, a total number of memory cells withinthe block that fall outside of one or more predetermined expected ranges. The method also includes identifying the block as a block in risk when the total number of memory cells satisfies a predetermined risk threshold. 公开用于通过单元探测进行故障预测的系统和方法。方法包含接收写入请求。所述方法还包含将预定数目的编程脉冲施加到闪存存储器装置的块内的多个存储器单元。所述方法还包含将验证脉冲施加到所述多个存储器单元中的每一相应存储器单元。所述方法还包含将所述多个存储器单元的编程状态存储到锁存器集合中。所述方法还包含基于所存储编程状态而确定所述块内的超出一或多个预定的预期范围的存储器单元的总数目。所述方法还包含在存储器单元的所述总数