Analog circuit fault feature extraction method and system based on preferred wavelet basis function

The invention discloses an analog circuit fault feature extraction method and system based on a preferred wavelet basis function, and belongs to the field of electronic circuit engineering and computer vision, and the method comprises the steps of obtaining output signals of an analog circuit during...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	DU BOLUN, SHI GUOLONG, AN BAORAN, HE YIGANG, HE LIULU, ZHANG CHAOLONG, YANG TING, XIONG YUANXIN
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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