Analog circuit fault feature extraction method and system based on preferred wavelet basis function

The invention discloses an analog circuit fault feature extraction method and system based on a preferred wavelet basis function, and belongs to the field of electronic circuit engineering and computer vision, and the method comprises the steps of obtaining output signals of an analog circuit during different faults; sequentially applying wavelet transformation methods based on different wavelet basis functions to extract features of output signals; for each characteristic, calculating the central position of each fault, the distance from each fault data point to the central position, the farthest position of the fault data point and the average position of the fault data points; and determining an optimal wavelet basis function for analog circuit fault feature extraction according to a score discrimination method. According to the method, the problems that the wavelet basis cannot be directly determined and needs to be set by an empirical method when wavelet transform is applied to feature extraction can be