Printed circuit board bare board defect detection method based on surface-to-surface parallelism

The invention discloses a printed circuit board bare board defect detection method based on surface-to-surface parallelism. The method specifically comprises the following steps: acquiring three-dimensional data of the surface of the bare board of the tested printed circuit board; calculating the gravity center of the tested printed circuit board; according to coordinate translation, the center ofgravity of the printed circuit board to be measured coincides with the center of gravity of a pre-stored standard theoretical printed circuit board; modeling the three-dimensional data information ofthe printed circuit board after gravity center superposition, calculating a phase difference according to polar coordinates of the two models, realizing parallelism of a detected printed circuit board surface and a theoretical printed circuit surface, and finally realizing defect classification through comparison to finish detection of defects of the bare board of the printed circuit board. According to the method, the om