External parameter determination method and device for image collection equipment and radar
The embodiment of the invention provides an external parameter determination method and device for image collection equipment and radar. The method comprises the following steps: obtaining initial values of external parameters of the image collection equipment and the laser radar, internal parameter...
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Format: | Patent |
Sprache: | chi ; eng |
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Zusammenfassung: | The embodiment of the invention provides an external parameter determination method and device for image collection equipment and radar. The method comprises the following steps: obtaining initial values of external parameters of the image collection equipment and the laser radar, internal parameters of the image collection equipment, image data acquired by the image collection equipment and pointcloud data acquired by the laser radar; wherein a preset calibration plate is arranged in a common detection area of the image collection device and the laser radar, and the preset calibration platehas image features and reflection features; converting the image data and the point cloud data into the same coordinate system according to the initial value and the internal parameter of the externalparameter; and adjusting the value of the external parameter, and outputting a calibration value of the external parameter when the image data and the point cloud data meet a preset coincidence condition, the preset coincidenc |
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