Test probe assembly and test socket

Disclosed is a test probe assembly. The test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and aninsulation probe supporting member configured to support the probe between an inner wall of the pipe...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	JEONG JAE-HWAN, KIM GEUN-SU, SHIN JUNGUL
Format:	Patent
Sprache:	chi ; eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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